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The ScanExpress JET tool is available as a stand-alone application or as a plug-in to ScanExpress TPG. Functional tests that are generated using ScanExpress JET are also compatible with the ScanExpress Runner test executive. Figure 2 depicts the ScanExpress JET GUI.
The ARC RTT supports single- and multi-core ARCv2 implementations, up to a maximum of four processors. The RTT system can be set up in many different configurations, which need to be specified as build-time configurations by including the trace generator in the core and the RTT module at build time. Everything is then automatically handled by the ARChitect tool. ARC RTT can support on- and off-chip memory setups to suit your application tracing needs.
Synopsys' Small Real-Time Trace (SmaRT) is a hardware module that can be integrated into any system-on-chip (SoC) within the Synopsys ARC configurable architecture. Delivered via the Synopsys ARChitect configuration tool as an IP library component, it enables rapid software debug with minimal increase in die size and little power consumption penalty.
If you have already installed OpenWrt and like to reflash for e.g. upgrading to a new OpenWrt version you can upgrade using the mtd command line tool. It is important that you put the firmware image into the ramdisk (/tmp) before you start flashing.
A complete set of tools for developers who want to create Eclipse plug-ins, Rich Client Applications or Remote Application Platform (RCP+RAP), plus Maven and Gradle tooling, and an XML editor. It contains the EGit tooling for accessing Git version control systems, and Eclipse Passage which helps with license management for Eclipse-based products.
The Modeling package provides tools and runtimes for building model-based applications. You can use it to graphically design domain models, to leverage those models at design time by creating and editing dynamic instances, to collaborate via Eclipse's team support with facilities for comparing and merging models and model instances structurally, and finally to generate Java code from those models to produce complete applications. In addition, via the package's discover catalog, you can easily install a wide range of additional powerful, model-based tools and runtimes to suit your specific needs.
High speed interconnects have been contributing to a majority of the delay present in modern sub-micron technologies. As the trend towards nanoscale continues, the effects from this delay will only worsen. Although it is possible to compensate for this with design tools, the limitations of testing tools are beginning to surface since parasitic coupling capacitance is not directly addressed by testing tools. A chip passing a manufacturing test with a specific pattern set only suggests that it will pass under the specific operating and stimulus conditions in which the patterns were applied on the tester. However, in the field, the surrounding paths around the critical paths may experience significantly different switching activity causing it to fail in the field. This chapter presents a structural test pattern generation procedure that magnifies the effect of parasitic crosstalk effects on critical paths. The pattern generation procedure considers the physical design and transition direction without simulation to increase the delay on the critical path. This work intends to minimize the escape ratio and improve in the field reliability. There are few modern testing tools that account for timing, but these products are not fully aware of the timing violations that may occur due to signal integrity degradation in modern technologies. This leads to silicon failures and escape.
Alternatively, gyroscope-based MWD (GWD) tools can continuously provide the attitude, velocity, and position of the drill bit regardless of the strong magnetic interferences. GWD tools with pure strapdown inertial navigation algorithm were proposed in [9,10] and the tools can save considerable rig time and remove the blind during the kickoff . The size of the fiber optic gyroscope or the laser optic gyroscope limits their application to the surveying of downhole drilling. The emergence of a low-cost, small-size, and high-performance MEMS sensor brings the gyroscopes to the small-diameter RMHWD. The MGWD device with two-axis gyroscopes and three-axis accelerometers in the application of small-diameter space (less than 24 millimeters) was proposed in , in which the angular rate (Y-axis) of MGWD tools is calculated by the accelerometers in the horizontal plane when the drilling equipment is under quasi-stationary conditions. The MGWD system can provide high-precision navigation solutions in short-term  and can perform real-time data transmission between the MGWD tools and the ground operation center. However, the integration calculation within resolving the mechanization of navigation solutions accumulates large errors because of biases of gyroscopes and accelerometers. The errors of inertial sensors are composed of two parts: deterministic errors and stochastic errors . The deterministic errors can partially be reduced by the calibration approach. Therefore, the residual of deterministic errors and the stochastic errors are main error sources of inertial sensors. To sum up, the problems should be solved for MGWD system are the elimination of the residual of deterministic errors and stochastic errors. 153554b96e